Texas Instruments Logik und Timing, sonstiges
| Teile-Nr. | Preis | Bestand | Hersteller | Kategorie | Category | Packaging | Rad Hard | Pin Count | Supplier Package | Standard Package Name | CECC Qualified | ESD Protection | Military | AEC Qualified | Auto motive | P PAP | ECCN Code | SVHC | SVHC Exceeds Threshold |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
CD40117BMTG4
Terminator -55°C to 125°C 14-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 14 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
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CD40117BMTE4
Terminator -55°C to 125°C 14-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 14 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
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CD40117BMT
Terminator -55°C to 125°C 14-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 14 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
NE567V
Tone Decoder 0°C to 70°C 8-Pin PDIP Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 8 | PDIP | DIP | No | No | No | No | No | Yes | Yes | ||||||
SN74LVT8986GGV
Transceiver -40°C to 85°C 64-Pin BGA MICROSTAR Tray
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | BGA MICROSTAR | BGA | No | No | No | No | No | EAR99 | Yes | Yes | |||||
SN74LVTH18502APMG4
Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | Yes | No | |||||||
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SN74ABT18502PMRG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | Yes | No | |||||||
SN74ABT8952DWR
Scan Test Device -40°C to 85°C 28-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8952DWE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | |||||||
SN74ABT8652DLG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | No | EAR99 | Yes | No | |||||
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SN74ABT8543DWE4
Scan Test Device -40°C to 85°C 28-Pin SOIC Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | |||||||
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SN74ABT8543DWG4
Scan Test Device -40°C to 85°C 28-Pin SOIC Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8652DWE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
SN74ABT8245DWE4
Scan Test Device -40°C to 85°C 24-Pin SOIC Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | Unknown | No | No | No | No | Yes | No | |||||
SN74ABT8952DLG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | No | No | |||||||
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SN74ABT8952DWG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8952DWRG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8952DL
Scan Test Device -40°C to 85°C 28-Pin SSOP Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | No | EAR99 | Yes | No | |||||
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SN74ABT8652DWG4
Scan Test Device -40°C to 85°C 28-Pin SOIC Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
SN74ABT8996PWR
Addressable Scan Port -40°C to 85°C 24-Pin TSSOP
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | TSSOP | SO | No | No | No | No | No | Yes | No | ||||||
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SN74ABT8646DLG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | EAR99 | Yes | No | ||||||
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SN74ABT8245DWRG4
Scan Test Device -40°C to 85°C 24-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | Unknown | No | No | No | No | Yes | No | |||||
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SN74ABT8646DWE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8646DWG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8952DW
Scan Test Device -40°C to 85°C 28-Pin SOIC Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | EAR99 | No | No |