Texas Instruments Logik und Timing, sonstiges
| Teile-Nr. | Preis | Bestand | Hersteller | Kategorie | Category | Packaging | Rad Hard | Pin Count | Supplier Package | Standard Package Name | CECC Qualified | ESD Protection | Military | AEC Qualified | Auto motive | P PAP | ECCN Code | SVHC | SVHC Exceeds Threshold |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
SN74LVC1404DCURG4
Oscillator Driver -40°C 85°C 8-Pin VSSOP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | No | 8 | VSSOP | SO | No | No | No | No | No | EAR99 | Yes | No | ||||
| SN74ABT8952DW Scan Test Device -40°C to 85°C 28-Pin SOIC Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | EAR99 | No | No | |||||
LM96550SQE/NOPB
Ultrasound Transmit Pulser 0°C to 70°C Medical 80-Pin WQFN EP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 80 | WQFN EP | QFN | No | No | No | No | No | EAR99 | No | ||||||
| SN74BCT8244ANT Scan Test Device 0°C to 70°C 24-Pin PDIP Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | PDIP | DIP | No | No | No | No | No | EAR99 | Yes | No | |||||
SNJ54BCT8374AFK
Scan Test Device -55°C to 125°C 28-Pin CLLCC Tube
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Bestand
10
72,9352 €
pro Stück
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Texas Instruments | Logik und Timing, Verschiedenes | No | 28 | CLLCC | LCC | No | Yes | No | No | No | EAR99 | Yes | Yes | ||||
| SN74ABT8646DLG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | No | EAR99 | Yes | No | |||||
| SN74LVTH18652APMG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | No | Yes | No | ||||||
74LVTH18512DGGRG4
Scan Test Device -40°C to 85°C 64-Pin TSSOP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | TSSOP | SO | No | No | No | No | No | EAR99 | Yes | No | |||||
74LVTH182504APMG4
Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
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Texas Instruments | Logik und Timing, Verschiedenes | No | 64 | LQFP | QFP | No | Unknown | No | No | No | No | EAR99 | Yes | No | |||
| SN74BCT8373ANT Scan Test Device 0°C to 70°C 24-Pin PDIP Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | PDIP | DIP | No | No | No | No | No | Yes | No | ||||||
SN74ABT18504PMG-917611301
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | Unknown | No | No | No | No | No | |||||||
SN74LVTH18512DGG
Scan Test Device -40°C to 85°C 64-Pin TSSOP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | TSSOP | SO | No | No | No | No | No | EAR99 | No | ||||||
| NE567V Tone Decoder 0°C to 70°C 8-Pin PDIP Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | 8 | PDIP | DIP | No | No | No | No | No | Yes | Yes | ||||||
SN74ACT1073DWR
Bus Termination Array -40°C to 85°C 20-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | No | 20 | SOIC | SO | Yes | No | No | No | No | EAR99 | No | No | ||||
| SN74ABT18245ADLRG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 56 | SSOP | SO | No | No | No | No | No | EAR99 | Yes | No | ||||
| 74ABTH18502APMRG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | No | Yes | No | ||||||
| SN74ABT8952DWRG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
| SN74ABT8952DWE4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74LVTH18504APM
Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
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Texas Instruments | Logik und Timing, Verschiedenes | No | 64 | LQFP | QFP | No | Unknown | No | No | No | No | EAR99 | Yes | No | |||
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5962-9172701Q3A
Scan Test Device -55°C to 125°C 28-Pin CLLCC Tube
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Texas Instruments | Logik und Timing, Verschiedenes | No | 28 | CLLCC | LCC | No | Yes | No | No | No | EAR99 | Yes | Yes | ||||
| SN74ABT18502PMRG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | No | Yes | No | ||||||
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SN74ABT18652PM
Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
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Texas Instruments | Logik und Timing, Verschiedenes | No | 64 | LQFP | QFP | No | Unknown | No | No | No | No | EAR99 | Yes | No | |||
| 74LVT18512DGGRE4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | TSSOP | SO | No | No | No | No | No | Yes | No | ||||||
| SN74BCT8373ADWG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
| SN74LVC1404DCTRE4 Oscillator Driver -40°C 85°C 8-Pin SSOP T/R |
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Texas Instruments | Logik und Timing, Verschiedenes | 8 | SSOP | SO | No | No | No | No | No | No | No |