Texas Instruments Sonstige
| Teile-Nr. | Preis | Bestand | Hersteller | Kategorie | Category | Packaging | Rad Hard | Pin Count | Supplier Package | Standard Package Name | CECC Qualified | ESD Protection | Military | AEC Qualified | Auto motive | P PAP | ECCN Code | SVHC | SVHC Exceeds Threshold |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
SN74ABT8952DLG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | No | No | |||||||
SN74ABT8952DWG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8952DWRG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8952DL
Scan Test Device -40°C to 85°C 28-Pin SSOP Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | No | EAR99 | Yes | No | |||||
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SN74ABT8652DWG4
Scan Test Device -40°C to 85°C 28-Pin SOIC Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
SN74ABT8996PWR
Addressable Scan Port -40°C to 85°C 24-Pin TSSOP
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | TSSOP | SO | No | No | No | No | No | Yes | No | ||||||
SN74ABT8646DLG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | EAR99 | Yes | No | ||||||
SN74ABT8245DWRG4
Scan Test Device -40°C to 85°C 24-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | Unknown | No | No | No | No | Yes | No | |||||
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SN74ABT8646DWE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8646DWG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | No | ||||||
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SN74ABT8952DW
Scan Test Device -40°C to 85°C 28-Pin SOIC Tube
|
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | EAR99 | No | No | |||||
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SN74ABT8646DLRG4
Scan Test Device
|
|
Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | No | No | |||||||
|
SN74ABT8245DWRE4
Scan Test Device -40°C to 85°C 24-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | Unknown | No | No | No | No | Yes | No | |||||
SN74ABT18245ADLG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 56 | SSOP | SO | No | No | No | No | Yes | No | |||||||
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SN74ABT18640DLG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 56 | SSOP | SO | No | No | No | No | Yes | No | |||||||
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SN74ABT8543DLG4
Scan Test Device -40°C to 85°C 28-Pin SSOP Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | No | No | |||||||
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SN74ABT8543DLRG4
Scan Test Device -40°C to 85°C 28-Pin SSOP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SSOP | SO | No | No | No | No | No | No | |||||||
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SN74ABT8952DWRE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 28 | SOIC | SO | No | No | No | No | No | No | |||||||
SN74ACT1073DWG4
Bus Termination Array -40°C to 85°C 20-Pin SOIC Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 20 | SOIC | SO | No | No | No | No | No | EAR99 | Yes | No | |||||
SN74ACT1071DRG4
Bus Termination Array -40°C to 85°C 14-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 14 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
SN74ACT1073NSRG4
Bus Termination Array -40°C to 85°C 20-Pin SOP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 20 | SOP | SO | No | No | No | No | No | Yes | No | ||||||
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SN74ACT1071DRE4
Bus Termination Array -40°C to 85°C 14-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 14 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
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SN74ACT1073NSRE4
Bus Termination Array -40°C to 85°C 20-Pin SOP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 20 | SOP | SO | No | No | No | No | No | Yes | No | ||||||
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SN74BCT8244ADWG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
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SN74BCT8373ADWG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | No | No | No | No | Yes | No |