Texas Instruments Sonstige
| Teile-Nr. | Preis | Bestand | Hersteller | Kategorie | Category | Packaging | Rad Hard | Pin Count | Supplier Package | Standard Package Name | CECC Qualified | ESD Protection | Military | AEC Qualified | Auto motive | P PAP | ECCN Code | SVHC | SVHC Exceeds Threshold |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
SN74BCT8244ANT
Scan Test Device 0°C to 70°C 24-Pin PDIP Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | PDIP | DIP | No | No | No | No | No | EAR99 | Yes | No | |||||
SN74BCT8374ADWG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
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SN74BCT8244ADWRE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | No | No | No | Yes | No | |||||||
SN74ACT1073DWRG4
Bus Termination Array -40°C to 85°C 20-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 20 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
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SN74ACT1073DWRE4
Bus Termination Array -40°C to 85°C 20-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 20 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
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SN74BCT8240ADWE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | No | No | No | Yes | No | |||||||
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SN74BCT8373ADWE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | No | No | No | No | Yes | No | ||||||
SN74LS292NE4
Frequency Dividers/Digital Timers 0°C to 70°C 16-Pin PDIP Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 16 | PDIP | DIP | No | No | No | No | No | EAR99 | Yes | No | |||||
LMC567CM
Tone Decoder -25°C to 100°C 8-Pin SOIC Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 8 | SOIC | SO | No | No | No | No | No | 5A991g. | Yes | Yes | |||||
SNJ54ABT8543JT
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | No | 28 | CDIP | DIP | No | Yes | No | No | No | No | ||||||
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SN74BCT8244ADWE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | SOIC | SO | No | No | No | No | EAR99 | Yes | No | ||||||
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SN74BCT8373ANT
Scan Test Device 0°C to 70°C 24-Pin PDIP Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 24 | PDIP | DIP | No | No | No | No | Yes | No | |||||||
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SN74LS294NE4
Frequency Dividers/Digital Timers 0°C to 70°C 16-Pin PDIP Tube
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Texas Instruments | Logik und Timing, Verschiedenes | 16 | PDIP | DIP | No | No | No | No | No | EAR99 | Yes | No | |||||
| SNJ54ABT18646HV Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 68 | CFPAK | FPAK | No | Yes | No | No | No | No | ||||||
SN74LVC1404DCURE4
Oscillator Driver -40°C 85°C 8-Pin VSSOP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 8 | VSSOP | SO | No | No | No | No | Yes | No | |||||||
SNJ54ABT8996JT
Addressable Scan Port -55°C 125°C 24-Pin CDIP Tube
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Texas Instruments | Logik und Timing, Verschiedenes | No | 24 | CDIP | DIP | No | Yes | No | No | No | No | ||||||
SNJ54ABT8652FK
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | No | 28 | CLLCC | LCC | No | Yes | No | No | No | No | ||||||
| SNJ54ABT8996W Addressable Scan Port -55°C 125°C 24-Pin CFPAK Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 24 | CFPAK | FPAK | No | Yes | No | No | No | No | ||||||
74ABT18245ADGGRE4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 56 | TSSOP | SO | No | No | No | No | Yes | No | |||||||
SN74LVTH18512DGG
Scan Test Device -40°C to 85°C 64-Pin TSSOP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | TSSOP | SO | No | No | No | No | No | EAR99 | No | ||||||
SN74LVTH18652APMG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | Yes | No | |||||||
LMC567CN
Tone Decoder -25°C to 125°C 8-Pin PDIP T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 8 | PDIP | DIP | No | No | No | No | Yes | Yes | |||||||
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LMC567CMX
Tone Decoder -25°C to 100°C 8-Pin SOIC T/R
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Texas Instruments | Logik und Timing, Verschiedenes | 8 | SOIC | SO | No | No | No | No | No | Yes | Yes | ||||||
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74ABTH182646APMG4
Scan Test Device
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | Yes | No | |||||||
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74LVTH182646APMG4
Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | Yes | No |