Texas Instruments Sonstige
| Teile-Nr. | Preis | Bestand | Hersteller | Kategorie | Packaging | Rad Hard | Pin Count | Supplier Package | Standard Package Name | CECC Qualified | ESD Protection | Military | AEC Qualified | Auto motive | P PAP | ECCN Code | SVHC | SVHC Exceeds Threshold |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 5962-9467201QXA Scan Test Device -55°C to 125°C 68-Pin CFPAK Tube |
|
Texas Instruments | Logik und Timing, Verschiedenes | No | 68 | CFPAK | FPAK | No | Yes | No | No | No | EAR99 | No | ||||
| 5962-9681101QXA Scan Test Device -55°C to 125°C 68-Pin CFPAK Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 68 | CFPAK | FPAK | No | Yes | No | No | No | EAR99 | No | ||||
| 74ABTH18502APMRG4 Scan Test Device |
|
Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | No | Yes | No | |||||
| 5962-9318601MLA Scan Test Device -55°C to 125°C 24-Pin CDIP Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 24 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes | |||
| 74LVTH18512DGGRE4 Scan Test Device -40°C to 85°C 64-Pin TSSOP T/R |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | TSSOP | SO | No | No | No | No | No | EAR99 | Yes | No | ||||
| 74ABTH182646APMG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | No | EAR99 | Yes | No | ||||
| 74ABT18245ADGGRE4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 56 | TSSOP | SO | No | No | No | No | No | Yes | No | |||||
| 5962-9681201Q3A Addressable Scan Port -55°C 125°C 28-Pin CLLCC Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 28 | CLLCC | LCC | No | Yes | No | No | No | No | |||||
| 74LVTH182646APMG4 Scan Test Device -40°C to 85°C 64-Pin LQFP Tray |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | No | Yes | No | |||||
| 74LVTH18514DGGRE4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | TSSOP | SO | No | No | No | No | No | Yes | No | |||||
| 8V182512IDGGREP Scan Test Device |
Von 8,5271 € bis 9,2409 €
pro Stück
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Texas Instruments | Logik und Timing, Verschiedenes | No | 64 | TSSOP | SO | No | No | No | No | No | EAR99 | Yes | No | |||
| 74LVT18512DGGRE4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | TSSOP | SO | No | No | No | No | No | Yes | No | |||||
| 74LVTH18514DGGRG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | TSSOP | SO | No | No | No | No | No | EAR99 | Yes | No | ||||
| 74LVTH182504APMG4 Scan Test Device -40°C to 85°C 64-Pin LQFP Tray |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 64 | LQFP | QFP | No | Unknown | No | No | No | No | EAR99 | Yes | No | ||
| 74LVTH182652APMG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | No | EAR99 | Yes | No | ||||
| 74LVTH182502APMG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | Unknown | No | No | No | No | EAR99 | Yes | No | |||
| 74LVTH182512DGGRE4 Scan Test Device -40°C to 85°C 64-Pin TSSOP T/R |
|
Texas Instruments | Logik und Timing, Verschiedenes | 64 | TSSOP | SO | No | No | No | No | No | Yes | No | |||||
| 74LVTH18502APMRG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 64 | LQFP | QFP | No | No | No | No | No | EAR99 | Yes | No | |||
| 5962-9172701QLA Scan Test Device -55°C to 125°C 24-Pin CDIP Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 24 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes | |||
| 5962-9172601MLA Scan Test Device -55°C to 125°C 24-Pin CDIP Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 24 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes | |||
| 5962-9458601QXA Scan Test Device -55°C to 125°C 28-Pin CDIP Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 28 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes | |||
| 5962-9461501QXA Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 28 | CDIP | DIP | No | Yes | No | No | No | No | |||||
| 5962-9681201QKA Addressable Scan Port -55°C 125°C 24-Pin CFPAK Tube |
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Texas Instruments | Logik und Timing, Verschiedenes | No | 24 | CFPAK | FPAK | No | Yes | No | No | No | No | |||||
| 74ABTH182502APMG4 Scan Test Device |
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Texas Instruments | Logik und Timing, Verschiedenes | 64 | LQFP | QFP | No | No | No | No | No | EAR99 | Yes | No | ||||
| 5962-9174601QLA Scan Test Device -55°C to 125°C 24-Pin CDIP Tube |
|
Texas Instruments | Logik und Timing, Verschiedenes | No | 24 | CDIP | DIP | No | Yes | No | No | No | EAR99 | Yes | Yes |